Authors : Weisi Guo (Cranfield University & Alan Turing Institute, University of Warwick, United Kingdom (Great Britain)); Bailu Jin and Schyler Sun (Cranfield University, United Kingdom (Great Britain)); Yue Wu (East China University of Science and Technology, China); Weijie Qi (Ranplan Ltd., United Kingdom (Great Britain)); Jie Zhang (University of Sheffield, Dept. of Electronic and Electrical Engineering, United Kingdom (Great Britain))